1
Standard Products
UT22VP10 Universal RAD
PAL
TM
Data Sheet
November 2000
FEATURES
q High speed Universal RAD
PAL
- tPD: 15.5ns, 20ns, 25ns maximum
- fMAX1: 33MHz maximum external frequency
- Supported by industry-standard programmer
- Amorphous silicon anti-fuse
q Asynchronous and synchronous RAD
PAL
operation
- Synchronous PRESET
- Asynchronous RESET
q Up to 22 input and 10 output drivers may be configured
- CMOS & TTL-compatible input and output levels
- Three-state output drivers
q Variable product terms, 8 to 16 per output
q 10 user-programmable output macrocells
- Registered or combinatorial operation
- Output driver polarity control selectable
- Two feedback paths available
q Radiation-hardened process and design; total dose irradia-
tion testing to MIL-STD-883, Method 1019
- Total dose: 1.0E6 rads(Si)
- Upset threshold 50 MeV-cm
2
/mg (min)
- Latchup immune(LET>109 MeV-cm
2
/mg)
q QML Q & V compliant
q Packaging options:
- 24-pin 100-mil center DIP (0.300 x 1.2)
- 24-lead flatpack (.45 x .64)
- 28-lead quad-flatpack (.45 x .45)
q Standard Military Drawing 5962-94754 available
13
Macrocell
8
14
Macrocell
10
15
Macrocell
12
16
Macrocell
14
17
Macrocell
16
18
Macrocell
16
19
Macrocell
14
20
Macrocell
12
21
Macrocell
10
22
Macrocell
8
23
11
10
9
8
7
6
5
4
3
2
1
Reset
Preset
CP
Figure 1. Block Diagram
12
PROGRAMMABLE ARRAY LOGIC
(132 X 44)
V
SS
24
V
DD
2
PRODUCT DESCRIPTION
The UT22VP10 RAD
PAL
is a fuse programmable logic array
device. The familiar sum-of-products (AND-OR) logic struc-
ture is complemented with a programmable macrocell. The
UT22VP10 is available in 24-pin DIP, 24-lead flatpack, and
28-lead quad-flatpack package offerings providing up to 22
inputs and 10 outputs. Amorphous silicon anti-fuse technology
provides the programming of each output. The user specifies
whether each of the potential outputs is registered or combina-
torial. Output polarity is also individually selected, allowing for
greater flexibility for output configuration. A unique output en-
able function allows the user to configure bidirectional I/O on
an individual basis.
The UT22VP10 architecture implements variable sum terms
providing 8 to 16 product terms to outputs. This feature provides
the user with increased logic function flexibility. Other features
include common synchronous preset and asynchronous reset.
These features eliminate the need for performing the initializa-
tion function.
The UT22VP10 provides a device with the flexibility to imple-
ment logic functions in the 500 to 800 gate complexity. The
flexible architecture supports the implementation of logic func-
tions requiring up to 21 inputs and only a single output or down
to 12 inputs and 10 outputs. Development and programming
support for the UT22VP10 is provided by DATA I/O.
DIP & FLATPACK PIN CONFIGURATION
QUAD-FLATPACK PIN CONFIGURATION
PIN NAMES
FUNCTION DESCRIPTION
The UT22VP10 RAD
PAL
implements logic functions as sum-
of-products expressions in a one-time programmable-AND/
fixed-OR logic array. User-defined functions are created by
programming the connections of input signals into the array.
User-configurable output structures in the form of I/O macro-
cells further increase logic flexibility.
CK/I
I
I
I
I
I
I
I
I
I
I
V
SS
V
DD
I/O0
I/O1
I/O2
I/O3
I/O4
I/O5
I/O6
I/O7
I/O8
I/O9
I
1
2
3
4
5
6
7
8
9
10
11
12
24
23
22
21
20
19
18
17
16
15
14
13
CK/I
Clock/Data Input
I
Data Input
I/O
Data Input/Output
V
DD
Power
V
SS
Ground
5
6
7
8
9
11
10
12
13
14
15
16
17
18
24
23
22
21
20
19
25
1
2
3
4
28
27
26
I
I
I
V
SS
I
I
I
I/O2
I/O3
I/O4
V
SS
I/O5
I/O7
I/O6
V
DD
CK/I
I
I
V
DD
I/O0 I/O1
V
SS
I
I
I
I/O9 I/O8
V
SS
3
Table 1. Macrocell Configuration Table
1, 2, 3
OVERVIEW
The UT22VP10 RAD
PAL
architecture (see figure 1) has 12 ded-
icated inputs and 10 I/Os to provide up to 22 inputs and 10
outputs for creating logic functions. At the core of the device
is a one-time programmable anti-fuse AND array that drives a
fixed OR array. With this structure, the UT22VP10 can imple-
ment up to 10 sum-of-products logic expressions.
Associated with each of the 10 OR functions is a macrocell
which is independently programmed to one of six different con-
figurations. The one-time programmable macro cells allow
each I/O to create sequential or combinatorial logic functions
with either Active-High or Active-Low polarity.
LOGIC ARRAY
The one-time programmable AND array of the UT22VP10
RAD
PAL
is formed by input lines intersecting product terms.
The input lines and product terms are used as follows:
44 input lines:
• 24 input lines carry the true and complement of the signals
applied to the input pins
• 20 lines carry the true and complement values of feedback
or input signals from the 10 I/Os
132 product terms:
• 120 product terms (arranged in 2 groups of 8, 10, 12, 14, and
16) used to form logic sums
• 10 output enable terms (one for each I/O)
• 1 global synchronous preset term
• 1 global asynchronous reset term
At each input-line/product-term intersection there is an anti-
fuse cell which determines whether or not there is a logical
connection at that intersection. A product term which is con-
nected to both the true and complement of an input signal will
always be logical zero, and thus will not effect the OR function
that it drives. When there are no connections on a product term
a Don’t Care state exists and that term will always be a logical
one.
PRODUCT TERMS
The UT22VP10 provides 120 product terms that drive the 10
OR functions. The 120 product terms connect to the outputs in
two groups of 8, 10, 12, 14, and 16 to form logical sums.
MACROCELL ARCHITECTURE
The output macrocell provides complete control over the archi-
tecture of each output. Configuring each output independently
permits users to tailor the configuration of the UT22VP10 to
meet design requirements.
Each I/O macrocell (see figure 2) consists of a D flip-flop and
two signal-select multiplexers. Three configuration select bits
controlling the multiplexers determine the configuration of
each UT22VP10 macrocell (see table 1). The configuration se-
lect bits determine output polarity, output type (registered or
combinatorial) and input feedback type (registered or I/O). See
figure 3 for equivalent circuits for the macrocell configurations.
OUTPUT FUNCTIONS
The signal from the OR array may be fed directly to the output
pin (combinatorial function) or latched in the D flip-flop (reg-
istered function). The D flip-flop latches data on the rising edge
of the clock. When the synchronous preset term is satisfied, the
Q output of the D flip-flop output will be set logical one at the
next rising edge of the clock input. Satisfying the asynchronous
clear term sets Q logical zero, regardless of the clock state. If
both terms are satisfied simultaneously, the clear will override
the preset.
C2
C1
C0
Output Type
Polarity
Feedback
0
0
0
Registered
Active LOW
Registered
0
0
1
Registered
Active HIGH
Registered
X
1
0
Combinatorial
Active LOW
I/O
X
1
1
Combinatorial
Active HIGH
I/O
1
0
0
Registered
Active LOW
I/O
1
0
1
Registered
Active HIGH
I/O
Notes:
1. 0 equals programmed low or programmed.
2. 1 equals programmed high or unprogrammed.
3. X equals don’t care.
4
OUTPUT POLARITY
Each macrocell can be configured to implement Active-High
or Active-Low logic. Programmable polarity eliminates the
need for external inverters.
OUTPUT ENABLE
The output of each I/O macrocell can be enabled or disabled
under the control a programmable output enable product term.
The output signal is propagated to the I/O pin when the logical
conditions programmed on the output enable term are satisfied.
Otherwise, the output buffer is driven to the high-impedance
state.
The output enable term allows the I/O pin to function as a ded-
icated input, dedicated output, or bidirectional I/O. When every
connection is unprogrammed, the output enable product term
permanently enables the output buffer and yields a dedicated
output. If every connection is programmed, the enable term is
logically low and the I/O functions as a dedicated input.
REGISTER FEEDBACK
The feedback signal to the AND array is taken from the Q output
when the I/O macrocell implements a registered function
(C
2
= 0, C
1
= 0).
BIDIRECTIONAL I/O
The feedback signal is taken from the I/O pin when the macro-
cell implements a combinatorial function (C
1
= 1) or a regis-
tered function (C
2
= 1, C
1
= 0). In this case, the pin can be used
as a dedicated input, a dedicated output, or a bidirectional I/O.
POWER-ON RESET
To ease system initialization, all D flip-flops will power-up to
a reset condition and the Q output will be low. The actual output
of the UT22VP10 will depend on the programmed output po-
larity. The reset delay time is 5
µ
s maximum. See the Power-up
Reset section for a more descriptive list of POR requirements.
ANTI-FUSE SECURITY
The UT22VP10 provides a security bit that prevents unautho-
rized reading or copying of designs programmed into the de-
vice. The security bit is set by the PLD programmer at the con-
clusion of the programming cycle. Once the security bit is set
it is no longer possible to verify (read) or program the
UT22VP10. NOTE: UTMC does not recommend using the
UT22VP10 unless the security fuse has been programmed.
The security bit must be blown to ensure proper function-
ality of the UT22VP10.
C
1
C
0
AR
C
2
SP
D
Q
CK
Q
C
1
C
0
OUTPUT
SELECT
MUX
INPUT/
FEEDBACK
MUX
Figure 2. Macrocell
C
1
C
2
5
Registered Feedback, Registered, Active-Low Output (C
2
= 0, C
1
= 0, C
0
= 0)
AR
SP
D
Q
CK
Q
AR
SP
D
Q
CK
Q
Registered Feedback, Registered, Active-High Output (C
2
= 0, C
1
= 0, C
0
= 1)
I/O Feedback, Combinatorial, Active-Low Output (C
2
= X, C
1
= 1, C
0
= 0)
Figure 3. Macrocell Configuration
(continued on next page)
6
I/O Feedback, Combinatorial, Active-High Output (C
2
= X, C
1
= 1, C
0
= 1)
AR
SP
D
Q
CK
Q
I/O Feedback, Registered, Active-Low Output (C
2
= 1, C
1
= 0, C
0
= 0)
AR
SP
D
Q
CK
Q
I/O Feedback, Registered, Active-High Output (C
2
= 1, C
1
= 0, C
0
= 1)
Figure 3. Macrocell Configuration
7
ABSOLUTE MAXIMUM RATINGS
1
Notes:
1. Stresses outside the listed absolute maximum ratings may cause permanent damage to the device. This is a stress rating only, functional operation of the
device at these or any other conditions beyond limits indicated in the operational sections is not recommended. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
2. Minimum voltage is -0.6V
DD
which may undershoot to -2.0V
DD
for pulses of less than 20ns. Maximum output pin voltage is V
DD
+0.75V
DD
which may
overshoot to +7.0V
DD
for pulses of less than 20ns.
3. (I
CC
max + I
OS
) 5.5V.
RECOMMENDED OPERATING CONDITIONS
Notes:
1. See page 12 for minimum V
DD
requirements at power-up.
SYMBOL
PARAMETER
LIMIT
UNITS
V
DD
Supply voltage
-0.3 to 7.0
V
V
I/O
2
Input voltage any pin
-0.3 to +7.0
V
T
STG
Storage Temperature range
-65 to +150
°
C
T
J
Maximum junction temperature
+175
°
C
T
S
Lead temperature (soldering 10 seconds)
+300
°
C
Θ
JC
Thermal resistance junction to case
20
°
C/W
I
I
DC input current
±10
mA
P
D
3
Maximum power dissipation
1.6
W
I
O
Output sink current
12
mA
SYMBOL
PARAMETER
LIMIT
UNITS
V
DD
1
Supply voltage
4.5 to 5.5
V
V
IN
Input voltage any pin
0 to V
DD
V
T
C
Temperature range
-55 to + 125
°
C
8
DC ELECTRICAL CHARACTERISTICS
1, 7
(V
DD
2
= 5.0V
±
10%; V
SS
= 0V
3,
-55
°°
C < T
C
< +125
°°
C)
Notes:
1. All specifications valid for radiation dose < 1E6 rads(Si).
2. See page 12 for minimum V
DD
requirements at power-up.
3. Maximum allowable relative shift equals 50mV.
4. Duration not to exceed 1 second, one output at a time.
5. Tested initially and after any design or process changes that affect that parameter and, therefore, shall be guaranteed to the limit specified.
6. All pins not being tested are to be open.
7. CMOS levels only tested on CMOS devices. TTL levels only tested on TTL devices.
SYMBOL
PARAMETER
CONDITION
MINIMUM
MAXIMUM
UNIT
V
IL
Low-level input voltage
TTL
--
.8
V
V
IH
High-level input voltage
TTL
2.2
--
V
V
IL
Low-level input voltage
CMOS
--
.3*V
DD
V
V
IH
High-level input voltage
CMOS
.7*V
DD
--
V
V
OL
Low-level output voltage
I
OL
= 12.0mA, V
DD
= 4.5V (TTL)
.4
V
V
OH
High-level output voltage
I
OH
= -12.0mA, V
DD
= 4.5V (TTL)
2.4
--
V
V
OL
Low-level output voltage
I
OL
= 200
µµ
A, V
DD
= 4.5V (CMOS)
--
V
SS
+0.05
V
V
OH
High-level output voltage
I
OH
= -200
µµ
A, V
DD
= 4.5V (CMOS)
V
DD
-0.05
--
V
I
IN
Input leakage current
V
IN
= V
DD
and V
SS
-10
10
µ
A
I
OZ
Three-state output leakage
current
V
O
= V
DD
and V
SS
, V
DD
= 5.5V
-10
10
µ
A
I
OS
4,5
Short-circuit output cur-
rent
V
DD
= 5.5V, V
O
= V
DD
V
DD
= 5.5V, V
O
= 0V
-160
160
mA
C
IN
5,6
Input capacitance
ƒƒ
=1MHz @0V
--
15
pF
C
I/O
5,6
Bidirectional capacitance
ƒƒ
=1MHz @0V
--
15
pF
I
DD
5
Supply current: Output
three-state, worst-case pat-
tern programmed,
ƒƒ
=f
MAX1
V
DD
= 5.5V
--
120
mA
I
DDQ
Supply current:
Unprogrammed
V
DD
= 5.5V
--
25
mA
9
AC CHARACTERISTICS READ CYCLE (Post-Radiation)
1,2
(V
DD
3
= 5.0V
±
10%; -55
°
C < T
C
< +125
°
C)
Notes:
1. Post-radiation performance guaranteed at 25
°
C per MIL-STD-883 Method 1019 at 1.0E6 rads(Si).
2. Guaranteed by characterization.
3. See page 12 for minimum V
DD
requirements for power-up.
4. Tested initially and after any design or process changes that affect.
5. Device 22VP10-15 tested at -55
°
C, +25
°
C and +50
°
C. At 125
°
C, tested to 20ns limit.
6. Tested on Programmed Test Ring only.
SYMBOL
PARAMETER
22VP10-15.5
MIN MAX
22VP10-20
MIN MAX
22VP10-25
MIN MAX
UNIT
t
PD
4,5,6
Input to output propagation delay
15.5
20
25
ns
t
EA
4
Input to output enable delay
23
23
25
ns
t
ER
4
Input to output disable delay
23
23
25
ns
t
CO
4,6
Clock to output delay
15
15
15
ns
t
CO2
4
Clock to combinatorial output delay via internal
registered feedback
24
24
28
ns
t
S
4,6
Input or feedback setup time
15
15
18
ns
t
H
4,6
Input or feedback hold time
2
2
2
ns
t
P
4
External clock period (t
CO
+ t
S
)
30
30
33
ns
t
WH, WL
4
Clock width, clock high time, clock low time
12
12
14
ns
f
MAX1
4,6
External maximum frequency (1/(t
CO
+ t
S
))
33
33
30
MHz
f
MAX2
4,6
Data path maximum frequency (1/(t
WH
+ t
WL
))
42
42
36
MHz
f
MAX3
4,6
Internal feedback maximum frequency (1/(t
CO
+ t
CF
))
32
32
32
MHz
t
CF
4
Register clock to feedback input
13
13
13
ns
t
AW
4
Asynchronous reset width
20
20
25
ns
t
AR
4
Asynchronous reset recovery time
20
20
25
ns
t
AP
4
Input to asynchronous reset
20
20
25
ns
t
SPR
4,6
Synchronous preset recovery time
20
20
25
ns
t
PR
4,6
Power up reset time
1.0
1.0
1.0
µ
s
10
V
T
t
PD
V
T
V
T
t
S
t
H
V
T
V
T
t
CO
INPUT OR
BIDIRECTIONAL
INPUT
COMBINATIONAL
OUTPUT
Combinatorial Output
INPUT OR
BIDIRECTIONAL
INPUT
REGISTERED
OUTPUT
CLOCK
Registered Output
V
T
t
WH
t
WL
Clock Width
V
T
INPUT OR
BIDIRECTIONAL
INPUT
OUTPUT
Combinatorial Output
(V
OH
- 0.5V, V
OL
+ 0.5V)
V
T
t
EA
t
ER
V
T
t
AP
t
AR
INPUT ASSERTING
ASYNCHRONOUS
RESET
V
T
V
T
CLOCK
REGISTERED
OUTPUT
t
AW
V
T
V
T
V
T
CLOCK
REGISTERED
OUTPUT
INPUT ASSERTING
SYNCHRONOUS
PRESET
t
S
t
H
t
SPR
V
T
t
CO
Asynchronous Reset
Synchronous Preset
Notes:
1. V
T
= 1.5V.
2. Input pulse amplitude 0V to 3.0V.
3. Input rise and fall times 3ns maximum.
Figure 4. AC Electrical
1,2,3
t
p