©2001 Fairchild Semiconductor Corporation
November 2001
Rev. B, November 2001
S
S
H7N60B
SSH7N60B
600V N-Channel MOSFET
General Description
These N-Channel enhancement mode power field effect
transistors are produced using Fairchild’s proprietary,
planar, DMOS technology.
This advanced technology has been especially tailored to
minimize on-state resistance, provide superior switching
performance, and withstand high energy pulse in the
avalanche and commutation mode. These devices are well
suited for high efficiency switch mode power supplies.
Features
• 7.3A, 600V, R
DS(on)
= 1.2
Ω
@V
GS
= 10 V
• Low gate charge ( typical 38 nC)
• Low Crss ( typical 23 pF)
• Fast switching
• 100% avalanche tested
• Improved dv/dt capability
Absolute Maximum Ratings
T
C
= 25°C unless otherwise noted
Thermal Characteristics
Symbol
Parameter
SSH7N60B
Units
V
DSS
Drain-Source Voltage
600
V
I
D
Drain Current
- Continuous (T
C
= 25°C)
7.3
A
- Continuous (T
C
= 100°C)
4.6
A
I
DM
Drain Current
- Pulsed
(Note 1)
29.2
A
V
GSS
Gate-Source Voltage
±
30
V
E
AS
Single Pulsed Avalanche Energy
(Note 2)
420
mJ
I
AR
Avalanche Current
(Note 1)
7.3
A
E
AR
Repetitive Avalanche Energy
(Note 1)
16
mJ
dv/dt
Peak Diode Recovery dv/dt
(Note 3)
5.5
V/ns
P
D
Power Dissipation (T
C
= 25°C)
160
W
- Derate above 25°C
1.28
W/°C
T
J
, T
STG
Operating and Storage Temperature Range
-55 to +150
°C
T
L
Maximum lead temperature for soldering purposes,
1/8
!
from case for 5 seconds
300
°C
Symbol
Parameter
Typ
Max
Units
R
θ
JC
Thermal Resistance, Junction-to-Case
--
0.78
°C
/
W
R
θ
CS
Thermal Resistance, Case-to-Sink
0.24
--
°C
/
W
R
θ
JA
Thermal Resistance, Junction-to-Ambient
--
40
°C
/
W
!
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"
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#
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S
D
G
TO-3P
SSH Series
G
S
D
Rev. B, November 2001
S
S
H7N60B
(Note 4)
(Note 4, 5)
(Note 4, 5)
(Note 4)
©2001 Fairchild Semiconductor Corporation
Electrical Characteristics
T
C
= 25°C unless otherwise noted
Notes:
1. Repetitive Rating : Pulse width limited by maximum junction temperature
2. L = 14.5mH, I
AS
= 7.3A, V
DD
= 50V, R
G
= 25
Ω,
Starting T
J
= 25°C
3. I
SD
"
7.0A, di/dt
"
300A/
µ
s, V
DD
"
BV
DSS,
Starting T
J
= 25°C
4. Pulse Test : Pulse width
"
300
µ
s, Duty cycle
"
2%
5. Essentially independent of operating temperature
Symbol
Parameter
Test Conditions
Min
Typ
Max
Units
Off Characteristics
BV
DSS
Drain-Source Breakdown Voltage
V
GS
= 0 V, I
D
= 250
µ
A
600
--
--
V
∆
BV
DSS
/
∆
T
J
Breakdown Voltage Temperature
Coefficient
I
D
= 250
µ
A, Referenced to 25°C
--
0.65
--
V/°C
I
DSS
Zero Gate Voltage Drain Current
V
DS
= 600 V, V
GS
= 0 V
--
--
10
µ
A
V
DS
= 480 V, T
C
= 125°C
--
--
100
µ
A
I
GSSF
Gate-Body Leakage Current, Forward
V
GS
= 30 V, V
DS
= 0 V
--
--
100
nA
I
GSSR
Gate-Body Leakage Current, Reverse
V
GS
= -30 V, V
DS
= 0 V
--
--
-100
nA
On Characteristics
V
GS(th)
Gate Threshold Voltage
V
DS
= V
GS
, I
D
= 250
µ
A
2.0
--
4.0
V
R
DS(on)
Static Drain-Source
On-Resistance
V
GS
= 10 V, I
D
= 3.65 A
--
1.0
1.2
Ω
g
FS
Forward Transconductance
V
DS
= 40 V, I
D
= 3.65 A
--
8.4
--
S
Dynamic Characteristics
C
iss
Input Capacitance
V
DS
= 25 V, V
GS
= 0 V,
f = 1.0 MHz
--
1380
1800
pF
C
oss
Output Capacitance
--
115
150
pF
C
rss
Reverse Transfer Capacitance
--
23
30
pF
Switching Characteristics
t
d(on)
Turn-On Delay Time
V
DD
= 300 V, I
D
= 7.0 A,
R
G
= 25
Ω
--
30
70
ns
t
r
Turn-On Rise Time
--
80
170
ns
t
d(off)
Turn-Off Delay Time
--
125
260
ns
t
f
Turn-Off Fall Time
--
85
180
ns
Q
g
Total Gate Charge
V
DS
= 480 V, I
D
= 7.0 A,
V
GS
= 10 V
--
38
50
nC
Q
gs
Gate-Source Charge
--
6.4
--
nC
Q
gd
Gate-Drain Charge
--
15
--
nC
Drain-Source Diode Characteristics and Maximum Ratings
I
S
Maximum Continuous Drain-Source Diode Forward Current
--
--
7.3
A
I
SM
Maximum Pulsed Drain-Source Diode Forward Current
--
--
29.2
A
V
SD
Drain-Source Diode Forward Voltage
V
GS
= 0 V, I
S
= 7.3 A
--
--
1.4
V
t
rr
Reverse Recovery Time
V
GS
= 0 V, I
S
= 7.0 A,
dI
F
/ dt = 100 A/
µ
s
--
415
--
ns
Q
rr
Reverse Recovery Charge
--
4.6
--
µ
C
Rev. B, November 2001
©2001 Fairchild Semiconductor Corporation
S
S
H7N60B
0
5
10
15
20
25
30
35
40
0
2
4
6
8
10
12
V
DS
= 300V
V
DS
= 120V
V
DS
= 480V
$
Note : I
D
= 7.0 A
V
GS
, G
at
e-
Sou
rc
e V
ol
tage [
V
]
Q
G
, Total Gate Charge [nC]
10
-1
10
0
10
1
0
500
1000
1500
2000
2500
3000
C
oss
C
iss
= C
gs
+ C
gd
(C
ds
= shorted)
C
oss
= C
ds
+ C
gd
C
rss
= C
gd
$
Notes :
1. V
GS
= 0 V
2. f = 1 MHz
C
rss
C
iss
C
apa
ci
ta
nc
e [
pF]
V
DS
, Drain-Source Voltage [V]
0.2
0.4
0.6
0.8
1.0
1.2
1.4
10
-1
10
0
10
1
150
%
$
Notes :
1. V
GS
= 0V
2. 250
&
s Pulse Test
25
%
I
DR
, R
ev
er
se D
rai
n C
ur
re
nt
[A
]
V
SD
, Source-Drain voltage [V]
0
5
10
15
20
25
0
1
2
3
4
5
V
GS
= 20V
V
GS
= 10V
$
Note : T
J
= 25
%
R
DS
(O
N)
[
'
],
D
rai
n-
Sour
ce
O
n-
R
es
is
tanc
e
I
D
, Drain Current [A]
2
4
6
8
10
10
-1
10
0
10
1
150
o
C
25
o
C
-55
o
C
$
Notes :
1. V
DS
= 40V
2. 250
&
s Pulse Test
I
D
, D
rai
n C
ur
re
nt
[A
]
V
GS
, Gate-Source Voltage [V]
10
-1
10
0
10
1
10
-1
10
0
10
1
V
GS
Top : 15.0 V
10.0 V
8.0 V
7.0 V
6.5 V
6.0 V
5.5 V
Bottom : 5.0 V
$
Notes :
1. 250
&
s Pulse Test
2. T
C
= 25
%
I
D
, D
rai
n C
ur
re
nt
[A
]
V
DS
, Drain-Source Voltage [V]
Typical Characteristics
Figure 5. Capacitance Characteristics
Figure 6. Gate Charge Characteristics
Figure 3. On-Resistance Variation vs
Drain Current and Gate Voltage
Figure 4. Body Diode Forward Voltage
Variation with Source Current
and Temperature
Figure 2. Transfer Characteristics
Figure 1. On-Region Characteristics
©2001 Fairchild Semiconductor Corporation
Rev. B, November 2001
S
S
H7N60B
1 0
-5
1 0
-4
1 0
-3
1 0
-2
1 0
-1
1 0
0
1 0
1
1 0
-2
1 0
-1
1 0
0
$
N o te s :
1 . Z
(
J C
(t) = 0 .7 8
%
/W M a x .
2 . D u ty F a c to r, D = t
1
/t
2
3 . T
J M
- T
C
= P
D M
* Z
(
J C
(t)
s in g le p u ls e
D = 0 .5
0 .0 2
0 .2
0 .0 5
0 .1
0 .0 1
Z
(
JC
(t), T
h
e
rm
a
l
R
e
s
p
o
n
s
e
t
1
, S q u a re W a v e P u ls e D u ra tio n [s e c ]
25
50
75
100
125
150
0
2
4
6
8
I
D
, Dr
ai
n Cu
rre
nt
[A
]
T
C
, Case Temperature [
%
]
10
0
10
1
10
2
10
3
10
-2
10
-1
10
0
10
1
10
2
10
µ
s
DC
10 ms
1 ms
100
µ
s
Operation in This Area
is Limited by R
DS(on)
$
Notes :
1. T
C
= 25
o
C
2. T
J
= 150
o
C
3. Single Pulse
I
D
, D
rai
n C
ur
re
nt
[A
]
V
DS
, Drain-Source Voltage [V]
-100
-50
0
50
100
150
200
0.0
0.5
1.0
1.5
2.0
2.5
3.0
$
Notes :
1. V
GS
= 10 V
2. I
D
= 3.5 A
R
DS
(O
N)
, (
N
or
m
al
iz
ed)
D
rai
n-
Sour
ce
O
n-
R
es
is
ta
nc
e
T
J
, Junction Temperature [
o
C]
-100
-50
0
50
100
150
200
0.8
0.9
1.0
1.1
1.2
$
Notes :
1. V
GS
= 0 V
2. I
D
= 250
&
A
BV
DS
S
, (
Nor
m
al
iz
ed)
Dr
ai
n-
So
ur
ce
B
rea
kd
ow
n V
ol
tag
e
T
J
, Junction Temperature [
o
C]
Typical Characteristics
(Continued)
Figure 9. Maximum Safe Operating Area
Figure 10. Maximum Drain Current
vs Case Temperature
Figure 7. Breakdown Voltage Variation
vs Temperature
Figure 8. On-Resistance Variation
vs Temperature
Figure 11. Transient Thermal Response Curve
t
1
P
DM
t
2
Rev. B, November 2001
©2001 Fairchild Semiconductor Corporation
S
S
H7N60B
Charge
V
GS
10V
Q
g
Q
gs
Q
gd
3mA
V
GS
DUT
V
DS
300nF
50K
)
200nF
12V
Same Type
as DUT
Charge
V
GS
10V
Q
g
Q
gs
Q
gd
3mA
V
GS
DUT
V
DS
300nF
50K
)
200nF
12V
Same Type
as DUT
V
GS
V
DS
10%
90%
t
d(on)
t
r
t
on
t
off
t
d(off)
t
f
V
DD
10V
V
DS
R
L
DUT
R
G
V
GS
V
GS
V
DS
10%
90%
t
d(on)
t
r
t
on
t
off
t
d(off)
t
f
V
DD
10V
V
DS
R
L
DUT
R
G
V
GS
E
AS
=
L I
AS
2
----
2
1
--------------------
BV
DSS
- V
DD
BV
DSS
V
DD
V
DS
BV
DSS
t
p
V
DD
I
AS
V
DS
(t)
I
D
(t)
Time
10V