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Electronic component partname: SN74BCT8374ADWR SN74BCT8374ADWR description: SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS Manufacturer: Texas Instruments Temperature range: Min: 0°C | Max: 70°C Chip package & pins: DW (Pins: 24) Datasheet file format: PDF (Requires Adobe Acrobat Reader) SN74BCT8374ADWR datasheet size: 294Kb Download SN74BCT8374ADWR datasheet: SN74BCT8374ADWR |