A29L160 Series
2M X 8 Bit / 1M X 16 Bit CMOS 3.0 Volt-only,
Preliminary
Boot Sector Flash Memory
PRELIMINARY (July, 2002, Version 0.0)
AMIC Technology, Inc.
Document Title
2M X 8 Bit / 1M X 16 Bit CMOS 3.0 Volt-only, Boot Sector Flash Memory
Revision History
Rev. No. History
Issue Date
Remark
0.0
Initial issue
July 31, 2002
Preliminary
A29L160 Series
2M X 8 Bit / 1M X 16 Bit CMOS 3.0 Volt-only,
Preliminary
Boot Sector Flash Memory
PRELIMINARY (July, 2002, Version 0.0)
1
AMIC Technology, Inc.
Features
n
Single power supply operation
- Full voltage range: 2.7 to 3.6 volt read and write
operations for battery-powered applications
- Regulated voltage range: 3.0 to 3.6 volt read and write
operations for compatibility with high performance 3.3
volt microprocessors
n
Access times:
- 70/90/120 (max.)
n
Current:
- 9 mA typical active read current
- 20 mA typical program/erase current
-
200 nA typical CMOS standby
-
200 nA Automatic Sleep Mode current
n
Flexible sector architecture
-
16 Kbyte/ 8 KbyteX2/ 32 Kbyte/ 64 KbyteX31 sectors
-
8 Kword/ 4 KwordX2/ 16 Kword/ 32 KwordX31 sectors
-
Any combination of sectors can be erased
-
Supports full chip erase
-
Sector protection:
A hardware method of protecting sectors to prevent
any inadvertent program or erase operations within
that sector. Temporary Sector Unprotect feature
allows code changes in previously locked sectors
n
Unlock Bypass Program Command
- Reduces overall programming time when issuing
multiple program command sequence
n
Top or bottom boot block configurations available
n
Embedded Algorithms
- Embedded Erase algorithm will automatically erase
the entire chip or any combination of designated
sectors and verify the erased sectors
- Embedded Program algorithm automatically writes and
verifies data at specified addresses
n
Typical 100,000 program/erase cycles per sector
n
20-year data retention at 125
°
C
-
Reliable operation for the life of the system
n
CFI (Common Flash Interface) compliant
- Provides device-specific information to the system,
allowing host software to easily reconfigure for
different Flash devices
n
Compatible with JEDEC-standards
- Pinout and software compatible with single-power-
supply Flash memory standard
-
Superior inadvertent write protection
n
Data
Polling and toggle bits
-
Provides a software method of detecting completion
of program or erase operations
n
Ready /
BUSY
pin (RY /
BY
)
- Provides a hardware method of detecting completion
of program or erase operations (not available on 44-
pin SOP)
n
Erase Suspend/Erase Resume
-
Suspends a sector erase operation to read data from,
or program data to, a non-erasing sector, then
resumes the erase operation
n
Hardware reset pin (
RESET
)
-
Hardware method to reset the device to reading array
data
n
Package options
-
44-pin SOP or 48-pin TSOP (I) or 48-ball TFBGA
A29L160 Series
PRELIMINARY (July, 2002, Version 0.0)
2
AMIC Technology, Inc.
General Description
The A29L160 is a 16Mbit, 3.0 volt-only Flash memory
organized as 2,097,152 bytes of 8 bits or 1,048,576 words of
16 bits each. The 8 bits of data appear on I/O
0
- I/O
7
; the 16
bits of data appear on I/O
0
~I/O
15
. The A29L160 is offered in
48-ball FBGA,
44-pin SOP and 48-Pin TSOP packages. This
device is designed to be programmed in-system with the
standard system 3.0 volt VCC supply. Additional 12.0 volt
VPP is not required for in-system write or erase operations.
However, the A29L160 can also be programmed in standard
EPROM programmers.
The A29L160 has the first toggle bit, I/O
6
, which indicates
whether an Embedded Program or Erase is in progress, or it
is in the Erase Suspend. Besides the I/O
6
toggle bit, the
A29L160 has a second toggle bit, I/O
2
, to indicate whether
the addressed sector is being selected for erase. The
A29L160 also offers the ability to program in the Erase
Suspend mode. The standard A29L160 offers access times
of 70, 90 and 120ns, allowing high-speed microprocessors to
operate without wait states. To eliminate bus contention the
device has separate chip enable (
CE
), write enable (
WE
)
and output enable (
OE
) controls.
The device requires only a single 3.0 volt power supply for
both read and write functions. Internally generated and
regulated voltages are provided for the program and erase
operations.
The A29L160 is entirely software command set compatible
with the JEDEC single-power-supply Flash standard.
Commands are written to the command register using
standard microprocessor write timings. Register contents
serve as input to an internal state-machine that controls the
erase and programming circuitry. Write cycles also internally
latch addresses and data needed for the programming and
erase operations. Reading data out of the device is similar to
reading from other Flash or EPROM devices.
Device programming occurs by writing the proper program
command sequence. This initiates the Embedded Program
algorithm - an internal algorithm that automatically times the
program pulse widths and verifies proper program margin.
Device erasure occurs by executing the proper erase
command sequence. This initiates the Embedded Erase
algorithm - an internal algorithm that automatically
preprograms the array (if it is not already programmed)
before executing the erase operation. During erase, the
device automatically times the erase pulse widths and
verifies proper erase margin. The Unlock Bypass mode
facilitates faster programming times by requiring only two
write cycles to program data instead of four.
The host system can detect whether a program or erase
operation is complete by observing the RY /
BY
pin, or
by
reading the I/O
7
(
Data
Polling) and I/O
6
(toggle) status bits.
After a program or erase cycle has been completed, the
device is ready to read array data or accept another
command.
The sector erase architecture allows memory sectors to be
erased and reprogrammed without affecting the data
contents of other sectors. The A29L160 is fully erased when
shipped from the factory.
The hardware sector protection feature disables operations
for both program and erase in any combination of the
sectors of memory. This can be achieved via programming
equipment.
The Erase Suspend/Erase Resume feature enables the user
to put erase on hold for any period of time to read data from,
or program data to, any other sector that is not selected for
erasure. True background erase can thus be achieved.
The hardware RESET pin terminates any operation in
progress and resets the internal state machine to reading
array data. The RESET pin may be tied to the system reset
circuitry. A system reset would thus also reset the device,
enabling the system microprocessor to read the boot-up
firmware from the Flash memory.
The device offers two power-saving features. When
addresses have been stable for a specified amount of time,
the device enters the automatic sleep mode. The system can
also place the device into the standby mode. Power
consumption is greatly reduced in both these modes.
A29L160 Series
PRELIMINARY (July, 2002, Version 0.0)
3
AMIC Technology, Inc.
Pin Configurations
n
SOP
n
TSOP (I)
A18
A17
A7
A6
A5
A4
A3
A2
A1
A0
CE
VSS
OE
I/O
0
I/O
14
I/O
8
I/O
7
I/O
15
(A-1)
VSS
BYTE
A16
A15
A14
A12
A11
A10
A19
A8
A9
A13
A29L160
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
RESET
WE
17
18
19
20
21
22
28
27
26
25
24
23
I/O
1
I/O
9
I/O
2
I/O
10
I/O
3
I/O
11
I/O
6
I/O
13
I/O
5
I/O
12
I/O
4
VCC
A29L160V
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
A14
A13
A12
A11
A10
A9
A8
NC
WE
RESET
NC
NC
RY/BY
A18
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
I/O
2
I/O
10
I/O
3
I/O
11
VCC
I/O
4
I/O
12
I/O
5
I/O
13
I/O
6
I/O
14
I/O
7
I/O
15
(A-1)
VSS
BYTE
A16
A15
A19
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
I/O
9
I/O
1
I/O
8
I/O
0
OE
VSS
CE
A0
A17
A7
A6
A5
A4
A3
A2
A1
n
TFBGA
A6
B6
C6
D6
E6
F6
G6
H6
TFBGA
Top View, Balls Facing Down
A5
B5
C5
D5
E5
F5
G5
H5
A4
B4
C4
D4
E4
F4
G4
H4
A3
B3
C3
D3
E3
F3
G3
H3
A2
B2
C2
D2
E2
F2
G2
H2
A1
B1
C1
D1
E1
F1
G1
H1
A13
A12
A14
A15
A16
BYTE
I/O
15
(A-1)
VSS
A9
A8
A10
A11
I/O
7
I/O
14
I/O
13
I/O
6
WE
RESET
NC
A19
I/O
5
I/O
12
VCC
I/O
4
RY/BY
NC
A18
NC
I/O
2
I/O
10
I/O
11
I/O
3
A7
A17
A6
A5
I/O
0
I/O
8
I/O
9
I/O
1
A3
A4
A2
A1
A0
CE
OE
VSS
A29L160 Series
PRELIMINARY (July, 2002, Version 0.0)
4
AMIC Technology, Inc.
Block Diagram
Pin Descriptions
Pin No.
Description
A0 - A19
Address Inputs
I/O
0
- I/O
14
Data Inputs/Outputs
I/O
15
Data Input/Output, Word Mode
I/O
15
(A-1)
A-1
LSB Address Input, Byte Mode
CE
Chip Enable
WE
Write Enable
OE
Output Enable
RESET
Hardware Reset (N/A A29L1601)
BYTE
Selects Byte Mode or Word Mode
RY/
BY
Ready/
BUSY
- Output
VSS
Ground
VCC
Power Supply
NC
Pin not connected internally
State
Control
Command
Register
Address Latch
X-decoder
Y-Decoder
Chip Enable
Output Enable
Logic
Cell Matrix
Y-Gating
VCC Detector
PGM Voltage
Generator
Data Latch
Input/Output
Buffers
Erase Voltage
Generator
VCC
VSS
WE
CE
OE
A0-A19
I/O
0
- I/O
15
(A-1)
Timer
STB
STB
RESET
Sector Switches
BYTE
RY/BY
A29L160 Series
PRELIMINARY (July, 2002, Version 0.0)
5
AMIC Technology, Inc.
Absolute Maximum Ratings*
Storage Temperature
Plastic Packages . . . . . . . . . . . . . . . . . . . . .0
°
C to + 70
°
C
Ambient Temperature
with Power Applied . . . . . . . . . . . . . . . . . . . 0
°
C to + 70
°
C
Voltage with Respect to Ground
VCC (Note 1) . . . . . . . . . . . . . . . . . . . . . . . -0.5V to +4.0V
A9,
OE
& RESET (Note 2) . . . . . . . . . . . . -0.5 to +12.5V
All other pins (Note 1) . . . . . . . . . . . . -0.5V to VCC + 0.5V
Output Short Circuit Current (Note 3) . . . . . . . . . 200mA
Notes:
1. Minimum DC voltage on input or I/O pins is -0.5V. During
voltage transitions, input or I/O pins may undershoot
VSS to -2.0V for periods of up to 20ns. Maximum DC
voltage on input and I/O pins is VCC +0.5V. During
voltage transitions, input or I/O pins may
overshoot to
VCC +2.0V for periods up to 20ns.
2. Minimum DC input voltage on A9,
OE
and RESET is -
0.5V. During voltage transitions, A9,
OE
and RESET
may overshoot VSS to -2.0V for periods of up to 20ns.
Maximum DC input voltage on A9 is +12.5V which may
overshoot to 14.0V for periods up to 20ns.
3. No more than one output is shorted at a time. Duration
of the short circuit should not be greater than one
second.
*Comments
Stresses above those listed under "Absolute Maximum
Ratings" may cause permanent damage to this device.
These are stress ratings only. Functional operation of
this device at these or any other conditions above
those indicated in the operational sections of these
specification is not implied or intended. Exposure to
the absolute maximum rating conditions for extended
periods may affect device reliability.
Operating Ranges
Commercial (C) Devices
Ambient Temperature (T
A
) . . . . . . . . . . . . . . 0
°
C to +70
°
C
VCC Supply Voltages
VCC for all devices . . . . . . . . . . . . . . . . . . +2.7V to +3.6V
Operating ranges define those limits between which the
functionally of the device is guaranteed.
Device Bus Operations
This section describes the requirements and use of the
device bus operations, which are initiated through the
internal command register. The command register itself
does not occupy any addressable memory location. The
register is composed of latches that store the commands,
along with the address and data information needed to
execute the command. The contents of the register serve
as inputs to the internal state machine. The state machine
outputs dictate the function of the device. The appropriate
device bus operations table lists the inputs and control
levels required, and the resulting output. The following
subsections describe each of these operations in further
detail.
Table 1. A29L160 Device Bus Operations
I/O
8
- I/O
15
Operation
CE
OE
WE
RESET
A0 – A19
(Note 1)
I/O
0
- I/O
7
BYTE
=V
IH
BYTE
=V
IL
Read
L
L
H
H
A
IN
D
OUT
D
OUT
I/O
8
~I/O
4
=High-Z
I/O
15
=A
-1
Write
L
H
L
H
A
IN
D
IN
D
IN
High-Z
CMOS Standby
VCC
±
0.3 V
X
X VCC
±
0.3 V
X
High-Z
High-Z
High-Z
Output Disable
L
H
H
H
X
High-Z
High-Z
High-Z
Hardware Reset
X
X
X
L
X
High-Z
High-Z
High-Z
Sector Protect
(See Note 2)
L
H
L
V
ID
Sector Address,
A6=L, A1=H, A0=L
D
IN
X
X
Sector Unprotect
(See Note 2)
L
H
L
V
ID
Sector Address,
A6=H, A1=H, A0=L
D
IN
X
X
Temporary Sector
Unprotect
X
X
X
V
ID
A
IN
D
IN
D
IN
X
Legend:
L = Logic Low = V
IL
, H = Logic High = V
IH
, V
ID
= 12.0
±
0.5V, X = Don't Care, D
IN
= Data In, D
OUT
= Data Out, A
IN
= Address In
Notes:
1. Addresses are A19:A0 in word mode (
BYTE=V
IH
), A19: A
-1
in byte mode (
BYTE=V
IL
).
2. See the “Sector Protection/Unprotection” section and Temporary Sector Unprotect for more information.
A29L160 Series
PRELIMINARY (July, 2002, Version 0.0)
6
AMIC Technology, Inc.
Word/Byte Configuration
The
BYTE
pin determines whether the I/O pins I/O
15
-I/O
0
operate in the byte or word configuration. If the
BYTE
pin
is set at logic ”1”, the device is in word configuration, I/O
15
-
I/O
0
are active and controlled by
CE
and
OE
.
If the
BYTE
pin is set at logic “0”, the device is in byte
configuration, and only I/O
0
-I/O
7
are active and controlled
by
CE
and
OE
. I/O
8
-I/O
14
are tri-stated, and I/O
15
pin is
used as an input for the LSB(A-1) address function.
Requirements for Reading Array Data
To read array data from the outputs, the system must drive
the
CE
and
OE
pins to V
IL
.
CE
is the power control and
selects the device.
OE
is the output control and gates
array data to the output pins.
WE
should remain at V
IH
all
the time during read operation. The
BYTE
pin determines
whether the device outputs array data in words and bytes.
The internal state machine is set for reading array data
upon device power-up, or after a hardware reset. This
ensures that no spurious alteration of the memory content
occurs during the power transition. No command is
necessary in this mode to obtain array data. Standard
microprocessor read cycles that assert valid addresses on
the device address inputs produce valid data on the device
data outputs. The device remains enabled for read access
until the command register contents are altered.
See "Reading Array Data" for more information. Refer to the
AC Read Operations table for timing specifications and to
the Read Operations Timings diagram for the timing
waveforms, l
CC1
in the DC Characteristics table represents
the active current specification for reading array data.
Writing Commands/Command Sequences
To write a command or command sequence (which
includes programming data to the device and erasing
sectors of memory), the system must drive
WE
and
CE
to
V
IL
, and
OE
to V
IH
. For program operations, the
BYTE
pin
determines whether the device accepts program data in
bytes or words, Refer to “Word/Byte Configuration” for more
information. The device features an Unlock Bypass mode to
facilitate faster programming. Once the device enters the
Unlock Bypass mode, only two write cycles are required to
program a word or byte, instead of four. The “
Word / Byte Program Command Sequence” section has
details on programming data to the device using both
standard and Unlock Bypass command sequence. An
erase operation can erase one sector, multiple sectors, or
the entire device. The Sector Address Tables indicate the
address range that each sector occupies. A "sector
address" consists of the address inputs required to uniquely
select a sector. See the "Command Definitions" section for
details on erasing a sector or the entire chip, or
suspending/resuming the erase operation.
After the system writes the autoselect command sequence,
the device enters the autoselect mode. The system can
then read autoselect codes from the internal register (which
is separate from the memory array) on I/O
7
- I/O
0
. Standard
read cycle timings apply in this mode. Refer to the
"Autoselect Mode" and "Autoselect Command Sequence"
sections for more information.
I
CC2
in the DC Characteristics table represents the active
current specification for the write mode. The "AC
Characteristics" section contains timing specification tables
and timing diagrams for write operations.
Program and Erase Operation Status
During an erase or program operation, the system may
check the status of the operation by reading the status bits
on I/O
7
- I/O
0
. Standard read cycle timings and I
CC
read
specifications apply. Refer to "Write Operation Status" for
more information, and to each AC Characteristics section
for timing diagrams.
Standby Mode
When the system is not reading or writing to the device, it
can place the device in the standby mode. In this mode,
current consumption is greatly reduced, and the outputs are
placed in the high impedance state, independent of the
OE
input.
The device enters the CMOS standby mode when the
CE
& RESET pins are both held at VCC
±
0.3V. (Note that this
is a more restricted voltage range than V
IH
.) If
CE
and
RESET are held at V
IH
, but not within VCC
±
0.3V, the
device will be in the standby mode, but the standby current
will be greater. The device requires the standard access
time (t
CE
) before it is ready to read data.
If the device is deselected during erasure or programming,
the device draws active current until the operation is
completed.
I
CC3
and
I
CC4
in the DC Characteristics tables represent the
standby current specification.
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