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MCM6227B
1
MOTOROLA FAST SRAM
1M x 1 Bit Static Random
Access Memory
The MCM6227B is a 1,048,576 bit static random–access memory organized
as 1,048,576 words of 1 bit. Static design eliminates the need for external clocks
or timing strobes while CMOS circuitry reduces power consumption and provides
for greater reliability.
The MCM6227B is each equipped with a chip enable (E) pin. This feature pro-
vides reduced system power requirements without degrading access time per-
formance.
The MCM6227B is available in 300 mil and 400 mil, 28–lead surface–mount
SOJ packages.
Single 5 V
±
10% Power Supply
Fast Access Times: 15/17/20/25/35 ns
Equal Address and Chip Enable Access Times
Input and Output are TTL Compatible
Three–State Output
Low Power Operation: 115/110/105/100/95 mA Maximum, Active AC
BLOCK DIAGRAM
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
MEMORY MATRIX
512 ROWS x
2048 x 1 COLUMNS
ROW
DECODER
INPUT
DATA
CONTROL
COLUMN I/O
COLUMN DECODER
Q
D
A
A
E
W
Order this document
by MCM6227B/D
MOTOROLA
SEMICONDUCTOR TECHNICAL DATA
PIN ASSIGNMENT
MCM6227B
WJ PACKAGE
400 MIL SOJ
CASE 810–03
19
18
17
16
15
28
27
26
25
24
23
22
21
20
A
A
A
A
A
A
NC
A
A
A
A
Q
W
VSS
VCC
A
A
A
A
A
NC*
A
A
A
A
D
A
10
11
12
13
14
1
2
3
4
5
6
7
8
9
A
Address Inputs
. . . . . . . . . . . . . . . . . . . .
W
Write Enable
. . . . . . . . . . . . . . . . . . . . .
E
Chip Enable
. . . . . . . . . . . . . . . . . . . . . .
D
Data Input
. . . . . . . . . . . . . . . . . . . . . . . .
Q
Data Output
. . . . . . . . . . . . . . . . . . . . .
NC
No Connection
. . . . . . . . . . . . . . . . . .
VCC
+ 5 V Power Supply
. . . . . . . . . . . . .
VSS
Ground
. . . . . . . . . . . . . . . . . . . . . . .
PIN NAMES
E
J PACKAGE
300 MIL SOJ
CASE 810B–03
*If not used for no connect, then do not ex-
ceed voltages of – 0.5 to VCC + 0.5 V.
This pin is used for manufacturing diag-
nostics.
REV 3
10/31/96
©
Motorola, Inc. 1994
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MCM6227B
2
MOTOROLA FAST SRAM
TRUTH TABLE
E
W
Mode
I/O Pin
Cycle
Current
H
X
Not Selected
High–Z
ISB1, ISB2
L
H
Read
Dout
Read
ICCA
L
L
Write
High–Z
Write
ICCA
H = High, L = Low, X = Don’t Care
ABSOLUTE MAXIMUM RATINGS
(See Note)
Rating
Symbol
Value
Unit
Power Supply Voltage Relative to VSS
VCC
– 0.5 to 7.0
V
Voltage Relative to VSS for Any Pin
Except VCC
Vin, Vout
– 0.5 to VCC + 0.5
V
Output Current
Iout
±
20
mA
Power Dissipation
PD
1.1
W
Temperature Under Bias
Tbias
– 10 to + 85
°
C
Operating Temperature
TA
0 to + 70
°
C
Storage Temperature
Tstg
– 55 to + 150
°
C
NOTE: Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are
exceeded. Functional operation should be restricted to RECOMMENDED OPER-
ATING CONDITIONS. Exposure to higher than recommended voltages for
extended periods of time could affect device reliability.
DC OPERATING CONDITIONS AND CHARACTERISTICS
(VCC = 5.0 V
±
10%, TA = 0 to 70
°
C, Unless Otherwise Noted)
RECOMMENDED OPERATING CONDITIONS
Parameter
Symbol
Min
Max
Unit
Supply Voltage (Operating Voltage Range)
VCC
4.5
5.5
V
Input High Voltage
VIH
2.2
VCC +0.3**
V
Input Low Voltage
VIL
– 0.5*
0.8
V
* VIL (min) = – 0.5 V dc; VIL (min) = – 2.0 V ac (pulse width
20 ns).
** VIH (max) = VCC + 0.3 V dc; VIH (max) = VCC + 2 V ac (pulse width
20 ns).
DC CHARACTERISTICS AND SUPPLY CURRENTS
Parameter
Symbol
Min
Max
Unit
Input Leakage Current (All Inputs, Vin = 0 to VCC)
Ilkg(I)
±
1
µ
A
Output Leakage Current (E = VIH, Vout = 0 to VCC)
Ilkg(O)
±
1
µ
A
AC Active Supply Current (Iout = 0 mA, VCC = max)
MCM6227B–15: tAVAV = 15 ns
MCM6227B–17: tAVAV = 17 ns
MCM6227B–20: tAVAV = 20 ns
MCM6227B–25: tAVAV = 25 ns
MCM6227B–35: tAVAV = 35 ns
ICCA
115
110
105
100
95
mA
AC Standby Current (VCC = max, E = VIH, f
fmax)
MCM6227B–15: tAVAV = 15 ns
MCM6227B–17: tAVAV = 17 ns
MCM6227B–20: tAVAV = 20 ns
MCM6227B–25: tAVAV = 25 ns
MCM6227B–35: tAVAV = 35 ns
ISB1
40
35
30
25
20
mA
CMOS Standby Current (E
VCC – 0.2 V, Vin
VSS + 0.2 V
or
VCC – 0.2 V, VCC = max, f = 0 MHz)
ISB2
5
mA
Output Low Voltage (IOL = + 8.0 mA)
VOL
0.4
V
Output High Voltage (IOH = – 4.0 mA)
VOH
2.4
V
This device contains circuitry to protect the
inputs against damage due to high static volt-
ages or electric fields; however, it is advised
that normal precautions be taken to avoid
application of any voltage higher than maxi-
mum rated voltages to these high–impedance
circuits.
This CMOS memory circuit has been de-
signed to meet the dc and ac specifications
shown in the tables, after thermal equilibrium
has been established. The circuit is in a test
socket or mounted on a printed circuit board
and transverse air flow of at least 500 linear feet
per minute is maintained.
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MCM6227B
3
MOTOROLA FAST SRAM
CAPACITANCE
(f = 1.0 MHz, dV = 3.0 V, TA = 25
°
C, Periodically Sampled Rather Than 100% Tested)
Characteristic
Symbol
Typ
Max
Unit
Input Capacitance
All Inputs Except Clocks and D, Q
E and W
Cin
4
5
6
8
pF
Input and Output Capacitance
D, Q
Cin, Cout
5
8
pF
AC OPERATING CONDITIONS AND CHARACTERISTICS
(VCC = 5.0 V
±
10%, TA = 0 to + 70
°
C, Unless Otherwise Noted)
Input Pulse Levels
0 to 3.0 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input Rise/Fall Time
2 ns
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input Timing Measurement Reference Level
1.5 V
. . . . . . . . . . . . . . .
Output Timing Measurement Reference Level
1.5 V
. . . . . . . . . . . . .
Output Load
See Figure 1a
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
READ CYCLE TIMING
(See Notes 1 and 2)
6227B–15
6227B–17
6227B–20
6227B–25
6227B–35
Parameter
Symbol
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Unit
Notes
Read Cycle Time
tAVAV
15
17
20
25
35
ns
2, 3
Address Access Time
tAVQV
15
17
20
25
35
ns
Enable Access Time
tELQV
15
17
20
25
35
ns
4
Output Hold from
Address Change
tAXQX
5
5
5
5
5
ns
Enable Low to Output
Active
tELQX
5
5
5
5
5
ns
5, 6, 7
Enable High to Output
High–Z
tEHQZ
6
7
7
8
8
ns
5, 6, 7
NOTES:
1. W is high for read cycle.
2. Product sensitivities to noise require proper grounding and decoupling of power supplies as well as minimization or elimination of bus con-
tention conditions during read and write cycles.
3. All timings are referenced from the last valid address to the first transitioning address.
4. Addresses valid prior to or coincident with E going low.
5. At any given voltage and temperature, tEHQZ max is less than tELQX min, both for a given device and from device to device.
6. Transition is measured
±
500 mV from steady–state voltage with load of Figure 1b.
7. This parameter is sampled and not 100% tested.
8. Device is continuously selected (E
VIL).
(a)
(b)
The table of timing values shows either a
minimum or a maximum limit for each param-
eter. Input requirements are specified from
the external system point of view. Thus, ad-
dress setup time is shown as a minimum
since the system must supply at least that
much time. On the other hand, responses
from the memory are specified from the de-
vice point of view. Thus, the access time is
shown as a maximum since the device never
provides data later than that time.
TIMING LIMITS
OUTPUT
Z0 = 50
RL = 50
VL = 1.5 V
5 pF
+ 5 V
OUTPUT
255
480
Figure 1. AC Test Loads
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MCM6227B
4
MOTOROLA FAST SRAM
READ CYCLE 1
(See Notes 1, 2, and 8)
A (ADDRESS)
Q (DATA OUT)
tAVAV
tAXQX
tAVQV
DATA VALID
PREVIOUS DATA VALID
READ CYCLE 2
(See Note 4)
tAVAV
tELQV
tELQX
tEHQZ
tAVQV
tELICCH
tEHICCL
ISB
Q (DATA OUT)
A (ADDRESS)
E (CHIP ENABLE)
SUPPLY CURRENT
ICC
HIGH–Z
DATA VALID
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MCM6227B
5
MOTOROLA FAST SRAM
WRITE CYCLE 1
(W Controlled, See Notes 1 and 2)
6227B–15
6227B–17
6227B–20
6227B–25
6227B–35
Parameter
Symbol
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Unit
Notes
Write Cycle Time
tAVAV
15
17
20
25
35
ns
3
Address Setup Time
tAVWL
0
0
0
0
0
ns
Address Valid to End of
Write
tAVWH
12
14
15
17
20
ns
Write Pulse Width
tWLWH,
tWLEH
12
14
15
17
20
ns
Data Valid to End of
Write
tDVWH
7
8
8
10
11
ns
Data Hold TIme
tWHDX
0
0
0
0
0
ns
Write Low to Data
High–Z
tWLQZ
6
7
7
8
8
ns
4, 5, 6
Write High to Output
Active
tWHQX
5
5
5
5
5
ns
4, 5, 6
Write Recovery Time
tWHAX
0
0
0
0
0
ns
NOTES:
1. A write occurs during the overlap of E low and W low.
2. Product sensitivities to noise require proper grounding and decoupling of power supplies as well as minimization or elimination of bus con-
tention conditions during read and write cycles.
3. All timings are referenced from the last valid address to the first transitioning address.
4. Transition is measured
±
500 mV from steady–state voltage with load of Figure 1b.
5. This parameter is sampled and not 100% tested.
6. At any given voltage and temperature, tWLQZ max is less than tWHQX min both for a given device and from device to device.
WRITE CYCLE 1
(W Controlled See Notes 1 and 2)
tAVWH
tWLQZ
tWHAX
tDVWH
A (ADDRESS)
E (CHIP ENABLE)
W (WRITE ENABLE)
D (DATA IN)
Q (DATA OUT)
DATA VALID
HIGH–Z
HIGH–Z
tAVAV
tAVWL
tWLEH
tWLWH
tWHDX
tWHQX
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MCM6227B
6
MOTOROLA FAST SRAM
WRITE CYCLE 2
(E Controlled, See Notes 1 and 2)
6227B–15
6227B–17
6227B–20
6227B–25
6227B–35
Parameter
Symbol
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Unit
Notes
Write Cycle Time
tAVAV
15
17
20
25
35
ns
3
Address Setup Time
tAVEL
0
0
0
0
0
ns
Address Valid to End of
Write
tAVEH
12
14
15
17
20
ns
Enable to End of Write
tELEH,
tELWH
10
11
12
15
20
ns
4, 5
Write Pulse Width
tWLEH
12
14
15
17
20
ns
Data Valid to End of
Write
tDVEH
7
8
8
10
11
ns
Data Hold Time
tEHDX
0
0
0
0
0
ns
Write Recovery Time
tEHAX
0
0
0
0
0
ns
NOTES:
1. A write occurs during the overlap of E low and W low.
2. Product sensitivities to noise require proper grounding and decoupling of power supplies as well as minimization or elimination of bus con-
tention conditions during read and write cycles.
3. All timings are referenced from the last valid address to the first transitioning address.
4. If E goes low coincident with or after W goes low, the output will remain in a high–impedance state.
5. If E goes high coincident with or before W goes high, the output will remain in a high–impedance state.
WRITE CYCLE 2
(E Controlled See Notes 1 and 2)
tEHDX
tDVEH
tEHAX
tELWH
tAVEL
tAVEH
DATA VALID
tAVAV
HIGH–Z
A (ADDRESS)
W (WRITE ENABLE)
E (CHIP ENABLE)
Q (DATA OUT)
D (DATA IN)
tELEH
tWLEH
ORDERING INFORMATION
(Order by Full Part Number)
Motorola Memory Prefix
Part Number
Package (J = 300 mil SOJ, WJ = 400 mil SOJ)
Full Part Numbers — MCM6227BJ15
MCM6227BJ15R2
MCM6227BWJ15
MCM6227BWJ15R2
MCM6227BJ17
MCM6227BJ17R2
MCM6227BWJ17
MCM6227BWJ17R2
MCM6227BJ20
MCM6227BJ20R2
MCM6227BWJ20
MCM6227BWJ20R2
MCM6227BJ25
MCM6227BJ25R2
MCM6227BWJ25
MCM6227BWJ25R2
MCM6227BJ35
MCM6227BJ35R2
MCM6227BWJ35
MCM6227BWJ35R2
Shipping Method (R2 = Tape and Reel, Blank = Rails)
MCM
6227B
XX
XX
XX
Speed (15 = 15 ns, 17 = 17 ns, 20 = 20 ns,
25 = 25 ns, 35 = 35 ns)
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MCM6227B
7
MOTOROLA FAST SRAM
28 LEAD
400 MIL SOJ
CASE 810–03
18.29
10.04
3.26
0.39
2.24
0.67
0.89
0.76
11.05
9.15
0.77
MIN
MIN
MAX
MAX
MILLIMETERS
INCHES
DIM
A
B
C
D
E
F
G
H
K
L
M
N
P
R
S
0
°
5
°
0
°
5
°
1.27 BSC
0.64 BSC
0.050 BSC
0.025 BSC
18.54
10.28
3.75
0.50
2.48
0.81
0.50
1.14
1.14
11.30
9.65
1.01
0.720
0.395
0.128
0.015
0.088
0.026
0.035
0.030
0.435
0.360
0.030
0.730
0.405
0.148
0.020
0.098
0.032
0.020
0.045
0.045
0.445
0.380
0.040
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. DIMENSION A & B DO NOT INCLUDE MOLD
PROTRUSION. MOLD PROTRUSION SHALL NOT
EXCEED 0.15 (0.006) PER SIDE.
3. CONTROLLING DIMENSION: INCH.
4. DIM R TO BE DETERMINED AT DATUM -T-.
PACKAGE DIMENSIONS
28 LEAD
300 MIL SOJ
CASE 810B–03
MIN
MIN
MAX
MAX
MILLIMETERS
INCHES
DIM
A
B
C
D
E
F
G
H
K
L
M
N
P
R
S
0
°
10
°
1.27 BSC
0.64 BSC
0.050 BSC
0.025 BSC
0
°
10
°
18.29
7.50
3.26
0.39
2.24
0.67
0.89
0.76
8.38
6.60
0.77
18.54
7.74
3.75
0.50
2.48
0.81
0.50
1.14
1.14
8.64
6.86
1.01
0.720
0.295
0.128
0.015
0.088
0.026
0.035
0.030
0.330
0.260
0.030
0.730
0.305
0.148
0.020
0.098
0.032
0.020
0.045
0.045
0.340
0.270
0.040
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. DIMENSION A & B DO NOT INCLUDE MOLD
PROTRUSION. MOLD PROTRUSION SHALL NOT
EXCEED 0.15 (0.006) PER SIDE.
3. CONTROLLING DIMENSION: INCH.
4. DIM R TO BE DETERMINED AT DATUM -T-.
5. 810B-01 AND -02 OBSOLETE, NEW STANDARD
810B-03.
28
1
15
14
L
G
M
K
DETAIL Z
DETAIL Z
S RAD
F
-B-
-A-
P
R
N
0.10 (0.004)
SEATING PLANE
-T-
0.25 (0.010)
T
S
B
0.18 (0.007)
M
T
S
A
0.18 (0.007)
T
S
B
S
S
M
C
E
D
24 PL
H BRK
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MCM6227B
8
MOTOROLA FAST SRAM
Motorola reserves the right to make changes without further notice to any products herein. Motorola makes no warranty, representation or guarantee regarding
the suitability of its products for any particular purpose, nor does Motorola assume any liability arising out of the application or use of any product or circuit, and
specifically disclaims any and all liability, including without limitation consequential or incidental damages. “Typical” parameters which may be provided in Motorola
data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals”
must be validated for each customer application by customer’s technical experts. Motorola does not convey any license under its patent rights nor the rights of
others. Motorola products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other
applications intended to support or sustain life, or for any other application in which the failure of the Motorola product could create a situation where personal injury
or death may occur. Should Buyer purchase or use Motorola products for any such unintended or unauthorized application, Buyer shall indemnify and hold Motorola
and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees
arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that
Motorola was negligent regarding the design or manufacture of the part. Motorola and are registered trademarks of Motorola,