SP574B/674B/1674B/774B
12–Bit Sampling A/D Converters
© Copyright 2000 Sipex Corporation
1
s
Complete Monolithic 12–Bit A/D Converters
with Sample–Hold, Reference, Clock and Tri–
state Outputs
s
Full Nyquist Sampling at All Sample Rates
s
Choice of Sampling Rates — 40kHz, 66kHz,
100kHz or 125kHz
s
Low Power Dissipation — 110mW
s
12–Bit Linearity Over Temperature
s
Commercial, Industrial and Military Tempera-
ture Ranges
s
Next–Generation Replacement for 574A, 674A,
1674A, 774A Devices
1
14
13
12
11
10
9
8
7
6
5
4
3
2
28
15
16
17
18
19
20
21
22
23
24
25
26
27
STS
DB11
DB10
DB9
DB8
DB7
DB6
DB5
DB4
DB3
DB2
DB1
DB0
DGND
VLOGIC 12/8
CS
A0
R/C
CE
VCC
REF
OUT
AGND
REF
IN
VEE
BIP
OFF
10V
IN
20V
IN
NIBBLE A
NIBBLE B
NIBBLE C
THREE–STATE BUFFERS AND CONTROL
N/C
7.5K
15K
15K
7.5K
7.5K
OFFSET/GAIN
TRIM
12–BIT
CAPACITANCE
DAC
COMP
REF
CONTROL LOGIC
12–BIT SAR
OSC
DESCRIPTION…
The SP574B/674B/1674B/774B (SPx74B) Series are complete 12–bit successive–approxi-
mation A/D converters integrated on a single die with tri-state output latches, an internal
reference, clock and a sample–hold. The new “B–Series” features true Nyquist sampling while
maintaining compatibility with prior versions. They are drop–in replacements for the older 574A/
674A/1674A/774A type devices.
®
SP574B/674B/1674B/774B
12–Bit Sampling A/D Converters
SP574B/674B/1674B/774B
12–Bit Sampling A/D Converters
© Copyright 2000 Sipex Corporation
2
ABSOLUTE MAXIMUM RATINGS
V
CC
to Digital Common .................................................. 0 to +16.5V
V
LOGIC
to Digital Common ................................................... 0 to +7V
Analog Common to Digital Common .........................................
±
1V
Control Inputs to Digital Common ................. –0.5V to V
LOGIC
+0.5V
(CE, CS, A
0
, 12/8, R/C)
Analog Input Voltage Range ...........................................
±
FS
±
30%
Analog Inputs to Analog Common ......................................
±
16.5V
(REF IN, BIP OFF, 10V
IN
)
20V
IN
to Analog Common ........................................................
±
24V
REF OUT ............................................... Indefinite short to common
................................................................... Momentary short to V
CC
Power Dissipation ............................................................. 1000mW
Lead Temperature, Soldering .................................. 300˚C, 10Sec
J/C ..................................................................................... 45˚C/W
MTBF–25˚C Ground Base ................................ 2.915 million hours
MTBF–125˚C Missile Launch ...................... 10.16 thousand hours
•
Inputs exceeding +30% or –30% of FS will cause erratic performance.
CAUTION:
ESD (ElectroStatic Discharge) sensitive
device. Permanent damage may occur on
unconnected devices subject to high energy
electrostatic fields. Unused devices must be
stored in conductive foam or shunts.
Personnel should be properly grounded prior
to handling this device. The protective foam
should be discharged to the destination
socket before devices are removed.
SPECIFICATIONS
(Typical @ 25
°
C with V
CC
= +15V, V
EE
= 0V, V
LOGIC
= +5V unless otherwise noted.)
PARAMETER
MIN.
TYP.
MAX.
UNIT
CONDITIONS
RESOLUTION
All models
12
Bits
ANALOG INPUTS
Input Ranges
Bipolar
±
5,
±
10
V
Unipolar
0 to +10, 0 to +20
V
Input Impedance
SP574B/SP674B
10 Volt Input
3.75
6.25
k
Ω
20 Volt Input
15
25
k
Ω
SP1674B/SP774B
10 Volt Input
1.875
3.125
k
Ω
20 Volt Input
7.45
12.42
k
Ω
Nyquist Frequency
SP574B
20
kHz
SP674B
33
kHz
SP1674B
50
kHz
SP774B
62.5
kHz
DIGITAL INPUTS
Logic Inputs CE, CS R/C, A
O
, 12/8
Logic 1
+2.4
+5.5
V
Logic 0
–0.3
+0.8
V
Current
±
0.1
±
50
µ
A
–0.3V to +5.5V Input
±
5
µ
A
0V to +5.5V Input
Capacitance
5
pF
12/8 Control Input
Hardwire to V
LOGIC
or DIGITAL COMMON
DIGITAL OUTPUTS
Logic Outputs DB
11
–DB
0
, STS
Logic 1
+2.4
V
I
SOURCE
≤
500
µ
A
Logic 0
+0.4
V
I
SINK
≤
1.6mA
Leakage (High Z State)
±
40
µ
A
Data bits only
Capacitance
5
pF
Parallel Data Output Codes
Unipolar
Positive true binary
Bipolar
Positive true offset binary
INTERNAL REFERENCE
Output Voltage
10.00
±
0.1
V
Output Current
2
mA
Note 1
SP574B/674B/1674B/774B
12–Bit Sampling A/D Converters
© Copyright 2000 Sipex Corporation
3
SPECIFICATIONS
(continued)
(Typical @ 25
°
C with V
CC
= +15V, V
EE
= 0V, V
LOGIC
= +5V unless otherwise noted.)
PARAMETER
MIN.
TYP.
MAX.
UNIT
CONDITIONS
CONVERSION TIME
SP574B
12–Bit Conversion
13
25
µ
s
8–Bit Conversion
10
19
µ
s
SP674B
12–Bit Conversion
9
15
µ
s
8–Bit Conversion
6
11.2
µ
s
SP1674B
12–Bit Conversion
5
10
µ
s
8–Bit Conversion
4
7.6
µ
s
SP774B
12–Bit Conversion
4
8
µ
s
8–Bit Conversion
3
6
µ
s
ACCURACY
Linearity Error
–A, –J, –S
±
1.0
LSB
@ 25
°
C and T
MIN
to T
MAX
–B, –K, –T
±
0.5
LSB
@ 25
°
C and T
MIN
to T
MAX
Differential Linearity Error
Note 2
–A, –J, –S
11
Bits
@ 25
°
C
11
Bits
T
MIN
to T
MAX
–B, –K, –T
12
Bits
@ 25
°
C
12
Bits
T
MIN
to T
MAX
Offset
Note 3
Unipolar
±
3
LSB
Bipolar
–A, –J, –S
±
10
LSB
–B, –K, –T
±
4
LSB
Full Scale (Gain) Error
% of full scale; T
MIN
to T
MAX
±
0.3
%FS
Note 4
–A
±
0.6
%FS
No adjustment @ 25
°
C
±
0.3
%FS
With adjustment @ 25
°
C
–B
±
0.45
%FS
No adjustment @ 25
°
C
±
0.15
%FS
With adjustment @ 25
°
C
–J
±
0.5
%FS
No adjustment @ 25
°
C
±
0.22
%FS
With adjustment @ 25
°
C
–K
±
0.4
%FS
No adjustment @ 25
°
C
±
0.12
%FS
With adjustment @ 25
°
C
–S
±
0.8
%FS
No adjustment @ 25
°
C
±
0.5
%FS
With adjustment @ 25
°
C
–T
±
0.6
%FS
No adjustment @ 25
°
C
±
0.25
%FS
With adjustment @ 25
°
C
STABILITY
Unipolar Offset
–J
±
10
ppm/
°
C
T
MIN
to T
MAX
–K, –A, –S
±
5
ppm/
°
C
T
MIN
to T
MAX
–B, –T
±
2.5
ppm/
°
C
T
MIN
to T
MAX
Bipolar Offset
–J, –A, –S
±
10
ppm/
°
C
T
MIN
to T
MAX
–K, –B, –T
±
5
ppm/
°
C
T
MIN
to T
MAX
Gain (Scale Factor)
–J, –A, –S
±
50
ppm/
°
C
T
MIN
to T
MAX
–K, –B, –T
±
25
ppm/
°
C
T
MIN
to T
MAX
SP574B/674B/1674B/774B
12–Bit Sampling A/D Converters
© Copyright 2000 Sipex Corporation
4
TYPICAL AC DYNAMICS
Measurement/Model
SP574B
SP674B
SP1674B
SP774B
Unit
Test Conditions:
Sampling Rate
40
67
100
125
kHz
Input Frequency (F
IN
)
19
31
49
61
kHz
SFDR
90
85
80
77
dB
THD
-80
-80
-77
-76
dB
SINAD
72
72
71
71
dB
SNR
72.5
72.5
72.5
72.5
dB
Note:
1.
Refer to Figure 10, for typical FFT at Nyquist sampling rate.
SPECIFICATIONS
(continued)
(Typical @ 25
°
C with V
CC
= +15V, V
EE
= 0V, V
LOGIC
= +5V unless otherwise noted.)
PARAMETER
MIN.
TYP.
MAX.
UNIT
CONDITIONS
POWER REQUIREMENTS
V
LOGIC
+4.5
+5.5
V
I
LOGIC
SP574B
1
3
mA
SP674B
1
3
mA
SP1674B
1
3
mA
SP774B
1
3
mA
V
CC
+11.4
+16.5
V
I
CC
SP574B
7
9
mA
SP674B
7
9
mA
SP1674B
10
12.5
mA
SP774B
10
12.5
mA
POWER DISSIPATION
SP574B
110
150
mW
SP674B
110
150
mW
SP1674B
155
200
mW
SP774B
155
200
mW
ENVIRONMENTAL
Operating Temperature Range
–J, –K
0
+70
°
C
–A, –B
–40
+85
°
C
–S, –T
–55
+125
°
C
Storage Temperature Range
–J, –K
–40
+85
°
C
–A, –B, –S, –T
–65
+150
°
C
Notes:
1.
Available for external loads. External load should not change during conversion. When supplying an
external load and operating on a +12V supply, a buffer amplifier must be provided for the reference
output.
2.
Minimum resolution for which no missing codes are guaranteed.
3.
Externally adjustable to zero. See
Calibration information.
4.
Fixed 50
Ω
resistor between REF OUT and REF IN.
5.
Specifications are identical for all models unless otherwise noted.
SP574B/674B/1674B/774B
12–Bit Sampling A/D Converters
© Copyright 2000 Sipex Corporation
5
CIRCUIT OPERATION…
The SPx74B are complete monolithic capacitor
DAC–based 12–bit analog-to-digital convert-
ers with integral voltage reference, comparator,
successive–approximation register (SAR),
sample–and–hold, clock, output buffers and
control circuitry. The high level of integration
of the SPx74B Series means they require few
external components.
When the control section of the SPx74B initiates
a conversion command, the clock is enabled and
the successive–approximation register is reset to
all zeros. Once the conversion cycle begins, it can
not be stopped or restarted and data is not available
from the output buffers. The SAR, timed by the
clock, sequences through the conversion cycle and
returns an end–of–convert flag to the control sec-
tion of the ADC. The clock is then disabled by the
control section, the output status goes low, and the
control section is enabled to allow the data to be
read by external command.
The internal SPx74B 12–bit CDAC is sequenced
by the SAR starting from the MSB to the LSB at
the beginning of the conversion cycle to provide
an output voltage from the CDAC that is equal
to the input signal voltage (which is divided by
the input voltage divider network). The com-
parator determines whether the addition of each
successively–weighted bit voltage causes the
CDAC output voltage summation to be greater
or less than the input voltage; if the sum is less,
the bit is left on; if more, the bit is turned off.
After testing all the bits, the SAR contains a 12–
bit binary code which accurately represents the
input signal to within
±
1
⁄
2
LSB.
The internal reference provides the voltage refer-
ence to the CDAC with excellent stability over
temperature and time. The reference is trimmed
to 10.00 Volts
±
1% and can supply up to 2mA to
an external load in addition to that required to
drive the reference input resistor (1mA) and
offset resistor (1mA) when operating with
±
15V
supplies. If the SPx74B is used with
±
12V
supplies, or if external current must be supplied
over the full temperature range, an external
buffer amplifier is recommended. Any external
load on the SPx74B reference must remain
constant during conversion.
FEATURES…
The SPx74B Series feature standard bipolar
and unipolar input ranges of 10V and 20V. Input
ranges are controlled by a bipolar offset pin and
laser-trimmed for specified linearity, gain and
offset accuracy. Power requirements are +5V
and +12V to +15V with a maximum dissipation
of 150mW at the specified voltages. Conversion
times of 8
µ
s, 10
µ
s, 15
µ
s and 25
µ
s are available,
as are units with 10, 25 or 50ppm/
°
C tempera-
ture coefficients for flexible matching to spe-
cific application requirements.
The SPx74B Series are available in nine prod-
uct grades for each conversion time. The –J
and –K models are specified over 0˚C to +
70˚C commercial temperature range; the –A
and –B models are specified over the –40˚C
to +85˚C industrial temperature range; the –S
and –T models are specified over the –55˚C to
+125˚C military temperature range. Package
options include 28–pin CDIP, 28–pin plastic
DIP (both narrow and wide), 28-pin PLCC
and 28–pin SOIC.
PIN ASSIGNMENTS…
PIN
FUNCTION
PIN
FUNCTION
1
V
LOGIC
28
STS
2
12/8
27
DB
11
(MSB)
3
CS
26
DB
10
4
A
0
25
DB
9
5
R/C
24
DB
8
6
CE
23
DB
7
7
V
CC
22
DB
6
8
REF OUT
21
DB
5
9
ANA GND(AC)
20
DB
4
10
REF IN
19
DB
3
11
N/C*
18
DB
2
12
BIP OFF
17
DB
1
13
10V
IN
16
DB
0
(LSB)
14
20V
IN
15
DIG. GND
*This pin is not connected inside the device so it can
be tied to –15V, ground, or left floating.
SP574B/674B/1674B/774B
12–Bit Sampling A/D Converters
© Copyright 2000 Sipex Corporation
6
SAMPLE–AND–HOLD FUNCTION
Although there is no sample–and–hold circuit in
the classical sense, the sampling nature of the
capacitive DAC makes the SPx74B appear to have
a built–in sample–and–hold. The sample–and–
hold function of the CDAC architecture is opti-
mized to provide full Nyquist sampling at any
maximum sampling rate. Because the S/H func-
tion is included in the ADC circuitry, the majority
of the S/H specifications are included within the A/
D specifications.
Note that some system architectures may use an
external sample–and–hold. The built–in S/H func-
tion of the SPx74B will provide additional isola-
tion. Once the internal sample is taken by the
CDAC capacitance, the input of the SPx74B is
disconnected from the input. This prevents tran-
sients occurring during conversion from being
inflicted upon the attached buffer. All other 574/
674–type circuits will cause a transient load cur-
rent on the input which will upset the buffer output
and may add error to the conversion itself. In
addition, the isolation of the input after the acqui-
sition time in the SPx74B allows you the opportu-
nity to release the HOLD on an external sample–
and–hold and start it tracking the next sample. This
will increase system throughput with your existing
components.
When using an external S/H, the SPx74B acts as
any other 574–type device because the internal S/
H is transparent. The sample/hold function in the
SPx74B is inherent to the capacitor DAC struc-
ture, and its timing characteristics are determined
by the internally generated clock. However, for
multiplexer operation, the internal S/H may elimi-
nate the need for an external S/H. The operation of
the S/H function is internal to the SPx74B and is
USING THE SPX74B SERIES
Typical Interface Circuit
The SPx74B is a complete A/D converter that is
fully operational when powered up and issued a
Start Convert Signal. Only a few external compo-
nents are necessary. The SPx74B Series have four
standard input ranges: 0V to +10V, 0V to +20V,
±
5V and
±
10V. Figure 2 depicts a typical interface
circuit for operating the SPx74B in a unipolar
input mode. Figure 3 depicts a typical interface
circuit for operating the SPx74B in a bipolar input
mode. Further information is given in the follow-
ing sections on these connections, but first a few
considerations concerning board layout to achieve
the best operation.
For each application of this device, strict attention
must be given to power supply decoupling, board
layout (to reduce pickup between analog and digi-
tal sections), and grounding. Digital timing, cali-
bration and the analog signal source must be
considered for correct operation.
To achieve specified accuracy, a double–sided
printed circuit board with a copper ground plane
on the component side is recommended. Keep
analog signal traces away from digital lines. It is
best to lay the PC board out such that there is an
analog section and a digital section with a single
point ground connection between the two through
an RF bead. If this is not possible, run analog
controlled through the normal R/C control line
(refer to Figure 1). When the R/C line makes a
negative transition, the SPx74B starts the timing
of the sampling and conversion. The first two
clock cycles are allocated to signal acquisition of
the input by the CDAC (this time is defined as
t
ACQ
). Following these two cycles, the input sample
is taken and held. The A/D conversion follows this
cycle with the duration controlled by the internal
clock cycle, which is determined by the specific
product model. Note that because the sample is
taken relative to the R/C transition, t
ACQ
is also the
traditional “aperture delay” of this internal sample
and hold. Since t
ACQ
is measured in clock cycles,
its duration will vary with the internal clock fre-
quency.
Offset, gain and linearity errors of the S/H circuit,
as well as the effects of its droop rate, are included
in the overall specs for the SPx74B.
R/C
CE
WAIT FOR
CONVERT SIGNAL
WAIT FOR
BUS READ
CONVERSION
VIN
CDAC VOLTAGE
0 VOLTS
t(ACQ)
ACQUISITION
TIME
ACQUISITION TIME =
APERTURE DELAY TIME =
0.12 x tCONVERT
Figure 1. Sample–and–Hold Function
SP574B/674B/1674B/774B
12–Bit Sampling A/D Converters
© Copyright 2000 Sipex Corporation
7
2
28
STS
DGND
12/8
CS
A0
R/C
CE
THREE–STATE BUFFERS AND CONTROL
NIBBLE A
NIBBLE B
NIBBLE C
27
26
25
24
23
22
21 20
19 18
17 16
OUTPUT BITS
MSB
LSB
3
4
5
6
CONTROL
LOGIC
OSCILLATOR
12–BITS
12–BITS
SAMPLE/HOLD
CDAC
LSB
MSB
OFFSET/GAIN
TRIM NETWORK
REF
REF
AMP
1
15
VLOGIC
+5V
7
11
VCC
VEE
9
AGND
+15V
N.C.
8
10
VREF
OUT
VREF
IN
R2
100
Ω
R1
100K
Ω
100K
Ω
-15V
+15V
100
Ω
10V
IN
20V
IN
BIP
OFF
13
14
12
ANALOG
INPUTS
0 TO 10V
0 TO 20V
12–BIT SAR
COMP
STROBE
10µF
0.1µF
10µF
0.1µF
+
+
Figure 2. Unipolar Input Connections
signals between ground traces and cross digital
lines at right angles only.
Grounding Considerations
Any ground path from the analog and digital
ground should be as low resistance as possible to
accommodate the ground currents present with
this device.
The analog ground current is approximately
6mA DC while the digital ground is 3mA DC.
The analog and digital common pins should be
tied together as close to the package as possible